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Summary of ISO/TC 201 Standard: XXIV, ISO 24237:2005—surface chemical analysis—X‐ray photoelectron spectroscopy—repeatability and constancy of intensity scale
Author(s) -
Seah M. P.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2495
Subject(s) - repeatability , calibration , intensity (physics) , x ray photoelectron spectroscopy , analytical chemistry (journal) , spectrometer , scale (ratio) , x ray , optics , chemistry , materials science , physics , nuclear magnetic resonance , mathematics , statistics , chromatography , quantum mechanics
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