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Field ion microscopy and beyond in some aspects of surface and nanoscience applications
Author(s) -
Tsong Tien T.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2471
Subject(s) - field ion microscope , scanning tunneling microscope , microscopy , resolution (logic) , atom probe , scanning probe microscopy , scanning ion conductance microscopy , analytical chemistry (journal) , nanotechnology , conductive atomic force microscopy , microscope , chemical imaging , field electron emission , scanning electron microscope , scanning capacitance microscopy , chemistry , atom (system on chip) , scanning confocal electron microscopy , ion , materials science , atomic force microscopy , optics , transmission electron microscopy , physics , electron , remote sensing , artificial intelligence , computer science , composite material , embedded system , chromatography , organic chemistry , hyperspectral imaging , geology , quantum mechanics
Two of the most important aspects of atomic resolution microscopy are the atomic resolution imaging of the sample and the nondestructive chemical analysis of preselected sample atoms. Field ion microscopy (FIM) is the first microscopy to achieve atomic image resolution, whereas the atom‐probe FIM is the first one to achieve single‐atom chemical analysis of preselected sample atoms, though, unfortunately, it is destructive. As microscopy progresses, now both electron microscope and scanning probe microscope have achieved atomic image resolution. STM may one day be able to do nondestructive chemical analysis of single sample atoms using thermally stable and chemically inert single‐atom sharp tip for the measurement of the electronic density of states of these atoms. Here, I will discuss a principle of STM chemical analysis as well as how field ion microscopy studies have instigated some of the later studies of scanning tunneling microscopy in surface and nanoscience applications. Copyright © 2007 John Wiley & Sons, Ltd.