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Coupling evanescent‐wave fluorescence imaging and spectroscopy with scanning probe microscopy: challenges and insights from TIRF–AFM
Author(s) -
Shaw James E.,
Oreopoulos John,
Wong Daniel,
Hsu Jenny C. Y.,
Yip Christopher M.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2444
Subject(s) - total internal reflection fluorescence microscope , microscopy , lipid bilayer , chemistry , spectroscopy , bilayer , fluorescence microscope , force spectroscopy , fluorescence lifetime imaging microscopy , scanning probe microscopy , nanotechnology , coupling (piping) , atomic force microscopy , fluorescence , membrane , materials science , optics , physics , biochemistry , quantum mechanics , metallurgy
Recent work has demonstrated that imaging platforms based on the integration of total internal reflection fluorescence microscopy (TIRFM)/spectroscopy with scanning probe microscopy are well‐suited for investigations of biological phenomena, ranging from lipid bilayer dynamics and membrane protein assembly to cellular dynamics and structures. We have shown that this approach is particularly compelling for studies of protein‐membrane interactions. While this functional imaging strategy has proved to be very useful for studies of cell dynamics, and most recently, in the study of single‐molecule dynamics by TIRF‐AFM‐based force spectroscopy, a number of key challenges remain to be resolved. Copyright © 2006 John Wiley & Sons, Ltd.