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Study on the origin of the anisotropic dielectric properties of the Au‐adsorbed Si(001) vicinal surface
Author(s) -
Minoda Hiroki,
Yamamoto Naoki
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2439
Subject(s) - vicinal , anisotropy , adsorption , polarization (electrochemistry) , dielectric , chemistry , transmission electron microscopy , molecular physics , condensed matter physics , materials science , chemical physics , optics , nanotechnology , optoelectronics , physics , organic chemistry
A study on the origin of the anisotropic dielectric properties of Au‐adsorbed Si(001) vicinal surface was carried out by observation of the electron‐beam‐induced light emission from the Si(001) 5 × 3.2‐Au surface and the Au‐adsorbed Si(111) vicinal surface by using a light detection system combined with a transmission electron microscope. It was found that the polarization of the light emitted from steps of the Si(001)‐Au surface is different from that from the Si(001) 5 × 3.2‐Au surface, but is similar to that from the (119) facet in the case of the Au adsorbed Si(001) vicinal surface. The polarization depends on the numbers of steps, and the step bands that include a larger number of steps show higher polarization. The polarization of the emitted light from the Au‐adsorbed Si(111) vicinal surface is much weaker compared to that from the Au‐adsorbed Si(001) surface. These results suggest that the origin of the anisotropic dielectric properties of the Au‐adsorbed Si(001) vicinal surface is due to the anisotropy of the atomic structure of the surface. Copyright © 2006 John Wiley & Sons, Ltd.