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PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction
Author(s) -
Schönhense G.,
Elmers H. J.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2433
Subject(s) - optics , synchrotron radiation , femtosecond , ultrashort pulse , photoemission electron microscopy , chromatic aberration , laser , physics , materials science , chromatic scale , electron microscope
The potential of time‐resolved photoemission electron microscopy (PEEM) for imaging ultrafast processes and for aberration correction in full‐field imaging is discussed. In particular, we focus on stroboscopic imaging of precessional magnetic excitations via XMCD‐PEEM exploiting the time structure of synchrotron radiation (magnetic field pulse pump–X‐ray probe). In a special bunch‐compression mode at BESSY, a time resolution of about 15 ps has been obtained. Further, we discuss an all‐optical pump–probe technique using femtosecond laser excitation. A highly promising alternative to stroboscopic imaging is an approach using time‐resolved image detection. As a second application of time‐resolved PEEM we discuss potential ways of aberration correction. These approaches go back to the old ideas of Scherzer in the light of state‐of‐the‐art equipment. The excellent time structure of synchrotron radiation or pulsed lasers along with advanced methods of time‐resolved image detection and fast electronic pulsers opens ways for driving the resolution limit of a PEEM into the range of a few nanometers. Copyright © 2006 John Wiley & Sons, Ltd.