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Surface structures of Ni 2 P (0001)—scanning tunneling microscopy (STM) and low‐energy electron diffraction (LEED) characterizations
Author(s) -
Moula Md. Golam,
Suzuki Shushi,
Chun WangJae,
Otani Shigeki,
Oyama S. Ted,
Asakura Kiyotaka
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2404
Subject(s) - scanning tunneling microscope , low energy electron diffraction , electron diffraction , crystallography , diffraction , surface structure , chemistry , scanning electron microscope , surface reconstruction , hexagonal crystal system , single crystal , surface (topology) , materials science , nanotechnology , optics , physics , geometry , mathematics , composite material
The Ni 2 P (0001) single crystal surface was characterized by low‐energy electron diffraction (LEED) and scanning tunneling microscopy (STM) to determine the atomic‐scale structure of the surface. LEED patterns revealed the presence of a sharp (1 × 1) structure and a reconstructed structure (2/3 × 2/3), while STM measurements showed only a well‐ordered (1 × 1) hexagonal structure. We found that the reconstructed (2/3 × 2/3) structure might be related to a Ni rearrangement that maintains the phosphorus (1 × 1) structure. Copyright © 2006 John Wiley & Sons, Ltd.