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Summary of ISO/TC201 technical report: ISO/TR 18392: 2005—Surface chemical analysis—X‐ray photoelectron spectroscopy—Procedures for determining backgrounds
Author(s) -
Kövér L.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2365
Subject(s) - x ray photoelectron spectroscopy , photoelectric effect , auger electron spectroscopy , auger , analytical chemistry (journal) , spectral line , x ray , solid surface , electron spectroscopy , excited state , chemistry , surface (topology) , atomic physics , materials science , physics , nuclear magnetic resonance , optics , optoelectronics , nuclear physics , chemical physics , environmental chemistry , geometry , mathematics , astronomy
Abstract ISO Technical Report 18392 provides the guidance for determining backgrounds in X‐ray photoelectron spectra. The methods of background determination described in this report are applicable for the quantitative evaluation of the spectra of photoelectrons and Auger electrons excited by X‐rays from solid surfaces and surface nanostructures. Copyright © 2006 John Wiley & Sons, Ltd.