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Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu 2 O
Author(s) -
Werner W. S. M.,
Zemek J.,
Jiricek P.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2272
Subject(s) - excitation , spectral line , atomic physics , volume (thermodynamics) , reflection (computer programming) , surface (topology) , electron , line (geometry) , x ray photoelectron spectroscopy , differential (mechanical device) , analytical chemistry (journal) , chemistry , materials science , computational physics , physics , mathematics , nuclear magnetic resonance , geometry , quantum mechanics , thermodynamics , chromatography , computer science , programming language
Reflection electron energy loss spectra (REELS) were measured for Cu and in situ ‐grown Cu 2 O and CuO. The differential surface and volume inelastic excitation probability is extracted from the REELS using a rigorous procedure developed recently. The resulting surface and volume loss probabilities for Cu agree quantitatively with theoretical calculations based on optical data. The resulting loss distributions can be used for a rigorous line shape analysis of XPS and AES spectra of these materials. Copyright © 2006 John Wiley & Sons, Ltd.