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X‐ray photoelectron spectroscopic study of the surface chemistry of soda‐lime glass in vacuum
Author(s) -
So L.,
Ng N.,
Bilek M.,
Pigram P. J.,
Brack N.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2222
Subject(s) - x ray photoelectron spectroscopy , carbon fibers , soda lime glass , chemistry , in situ , analytical chemistry (journal) , soda lime , argon , materials science , chemical engineering , environmental chemistry , composite material , organic chemistry , composite number , engineering
The surface chemistry of heat‐treated soda‐lime glass surfaces in vacuum was studied with X‐ray photoelectron spectroscopy (XPS). It was shown to vary greatly, in terms of carbon content, with different preparation environments before analysis. Specially designed miniature evacuated glass panels were used and a lever device was incorporated into the XPS system for in situ sample breakage. A considerable amount of carbon was found on glass surfaces exposed to air before XPS. Less carbon was found on surfaces exposed to an argon environment, and an even smaller amount of carbon could be detected when samples were broken in situ . The atomic percentage of carbon‐related compounds is found to increase with increasing air exposure time. This study shows that when analysing carbon and its related compounds on the inner glass surfaces of any evacuated device, it is important to break the sample in situ to minimise carbon contamination. Copyright © 2006 John Wiley & Sons, Ltd.