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Measuring the energy of the graphite π + σ plasmon peak
Author(s) -
Filippi M.,
Calliari L.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2221
Subject(s) - plasmon , x ray photoelectron spectroscopy , spectral line , electron energy loss spectroscopy , reflection (computer programming) , graphite , spectroscopy , surface plasmon , energy (signal processing) , atomic physics , core (optical fiber) , electron , materials science , optics , chemistry , physics , nuclear magnetic resonance , computer science , quantum mechanics , composite material , programming language
We examine the graphite plasmon loss structure in reflection electron energy loss spectroscopy (REELS) and XPS with respect to the issue of measuring the energy, E p , of the π + σ plasmon peak. The two spectra differ in shape because they are based on different physical processes. In fact, a static core hole—leading to intrinsic (in addition to extrinsic) losses—exists only for XPS. We show that no single energy can be measured on the two spectra for the π + σ peak. Possible procedures to deal with the matter are considered. Copyright © 2006 John Wiley & Sons, Ltd.