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Investigation of passive films grown on biocompatible Ti‐50Zr and Ti‐13Zr‐13Nb alloys by XPS
Author(s) -
Oliveira N. T. C.,
Biaggio S. R.,
Nascente P. A. P.,
RochaFilho R. C.,
Bocchi N.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2201
Subject(s) - x ray photoelectron spectroscopy , alloy , materials science , oxide , inductively coupled plasma , titanium , titanium alloy , chemical engineering , metallurgy , analytical chemistry (journal) , plasma , chemistry , chromatography , physics , quantum mechanics , engineering
In this work, XPS investigations on the composition of anodic films electrochemically grown on heat‐treated Ti‐50Zr (at.%) and Ti‐13Zr‐13Nb (wt.%) alloys in 0.15 mol dm −3 Na 2 SO 4 at room temperature are reported. The XPS analyses on anodic films of different thicknesses revealed for both alloys a gradual enrichment of the oxide film in Ti as the film thickness was increased. For the thickest oxide films, this Ti enrichment in the oxide was about 8% for the Ti‐13Nb‐13Zr alloy and about 9% for the Ti‐50Zr alloy, when compared with the nominal values for both alloys determined by inductively coupled plasma‐atomic emission spectroscopy (ICP‐AES). Copyright © 2006 John Wiley & Sons, Ltd.