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XPS MultiQuant: a step towards expert systems
Author(s) -
Mohai M.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2198
Subject(s) - x ray photoelectron spectroscopy , flexibility (engineering) , computer science , transfer (computing) , data exchange , file transfer , computational science , database , operating system , engineering , chemical engineering , mathematics , statistics
A thorough evaluation of photoelectron spectra is impossible without involvement of data systems. It is advantageous if the different programmes are easily able to communicate with each other. This connectivity may also serve as a base for future expert systems. The well‐known VAMAS file format provides the first necessary step, converting the spectra into forms portable between various platforms. In this paper, a new file format, the XPS Reduced Data Exchange File , is proposed, which defines an ‘interface’ between programs to transfer the derived XPS data. XPS MultiQuant, which can be used routinely together with various spectrum processing packages to improve the flexibility and precision of quantitative calculations, is a typical target application requiring transfer of reduced experimental data (e.g., selected elements, line position, intensity data, etc.). The latest version of XPS MultiQuant already implements the XPS Reduced Data Exchange Files proposed here, to transfer necessary data between programs. Copyright © 2006 John Wiley & Sons, Ltd.