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XPS and RBS characterizations of electrosynthesized polypyrrole films doped with a heteropolyanion, SiMo 12 O 40 4−
Author(s) -
DebiemmeChouvy Catherine,
Bernard MarieClaude,
Cachet Hubert,
Deslouis Claude
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2167
Subject(s) - electrosynthesis , x ray photoelectron spectroscopy , polypyrrole , quartz crystal microbalance , doping , materials science , electrochemistry , conductive polymer , analytical chemistry (journal) , thin film , polymer , chemical engineering , nanotechnology , chemistry , electrode , polymerization , optoelectronics , composite material , adsorption , organic chemistry , engineering
In this paper, the electrosynthesis of polypyrrole (PPy) films doped with a Keggin‐type heteropolyanion, SiMo 12 O 40 4− , is reported. The in situ electrochemical growth of the hybrid film was conducted using an electrochemical quartz crystal microbalance (EQCM) that allowed us to evaluate the doping level of the polymers, which were synthesized in galvanostatic mode. By combining EQCM with chemical analyses, such as X‐ray photoelectron spectroscopy and Rutherford backscattering spectroscopy, it was evidenced that the doping level of the polymer depends on the current imposed during the PPy film synthesis. Copyright © 2006 John Wiley & Sons, Ltd.