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Characterisation of sol–gel crystalline V 2 O 5 thin films after Li intercalation cycling
Author(s) -
Alamarguy D.,
Castle J. E.,
Ibris N.,
Salvi A. M.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2138
Subject(s) - x ray photoelectron spectroscopy , intercalation (chemistry) , thin film , materials science , microstructure , scanning electron microscope , sol gel , impurity , lithium (medication) , stoichiometry , analytical chemistry (journal) , electrochemistry , chemical engineering , crystallography , chemistry , nanotechnology , inorganic chemistry , composite material , electrode , medicine , organic chemistry , endocrinology , engineering , chromatography
Thin sol–gel V 2 O 5 films were examined before and after lithium electrochemical intercalation/de‐intercalation cycles. X‐ray photoelectron spectroscopy (XPS) was used for surface characterisation, while microstructure and morphological characteristics were studied by atomic force and electron microscopies (AFM, SEM and TEM). Microscopy showed the film, as prepared, to be highly crystalline, having a layered structure and spectroscopy showed good stoichiometry and few impurities. Electrochemical cycling and rinsing for analysis leads, eventually, to porosity and decrease in film thickness, probably through degradation of grain boundaries. Copyright © 2006 John Wiley & Sons, Ltd.