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Report on the 42nd IUVSTA workshop ‘Electron scattering in solids: from fundamental concepts to practical applications’
Author(s) -
Kövér L.,
Powell C. J.
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2137
Subject(s) - inelastic mean free path , electron spectroscopy , inelastic scattering , electron , electron energy loss spectroscopy , electron scattering , auger electron spectroscopy , x ray photoelectron spectroscopy , atomic physics , scattering , spectroscopy , electron microprobe , chemistry , core electron , elastic scattering , physics , materials science , optics , nuclear physics , mineralogy , nuclear magnetic resonance , quantum mechanics
A summary is given of the workshop entitled ‘Electron Scattering in Solids: from fundamental concepts to practical applications,’ which was held in Debrecen, Hungary, on July 4–8, 2004, under the sponsorship of the International Union of Vacuum Science, Technique, and Applications (IUVSTA). This workshop was held to review the present status and level of understanding of electron‐scattering processes in solids, to identify issues of key importance (hot topics) in the light of the most recent scientific results, and to stimulate discussions leading to a deeper understanding and new solutions of current problems. This report contains summaries of presentations and discussions in sessions on elastic scattering of electrons by atoms and solids, inelastic scattering of electrons in solids, modeling of electron transport in solids and applications, and software. The principal areas of application include Auger‐electron spectroscopy (AES), X‐ray photoelectron spectroscopy, elastic‐peak electron spectroscopy (EPES), reflection electron energy‐loss spectroscopy (REELS), secondary‐electron microscopy, electron‐probe microanalysis (EPMA), and the use of coincidence techniques in electron‐scattering experiments. A major focus of the workshop was determination of the inelastic mean free path of electrons for various surface spectroscopies, particularly corrections for surface and core‐hole effects. Published in 2005 by John Wiley & Sons, Ltd.