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Transmission‐function correction for XPS spectrum imaging
Author(s) -
Walton John,
Fairley Neal
Publication year - 2006
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2131
Subject(s) - x ray photoelectron spectroscopy , function (biology) , imaging spectroscopy , transmission (telecommunications) , pixel , energy (signal processing) , image (mathematics) , spectrum (functional analysis) , chemical state , spectroscopy , optics , analytical chemistry (journal) , computer science , materials science , chemistry , physics , nuclear magnetic resonance , artificial intelligence , telecommunications , environmental chemistry , quantum mechanics , evolutionary biology , biology
A procedure is described to characterise the performance of an imaging X‐ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical‐state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.