Transmission‐function correction for XPS spectrum imaging | Zendy

Walton John | Zendy; Fairley Neal | Zendy

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Transmission‐function correction for XPS spectrum imaging

Author(s) -

Walton John,

Fairley Neal

Publication year - 2006

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.2131

Subject(s) - x ray photoelectron spectroscopy , function (biology) , imaging spectroscopy , transmission (telecommunications) , pixel , energy (signal processing) , image (mathematics) , spectrum (functional analysis) , chemical state , spectroscopy , optics , analytical chemistry (journal) , computer science , materials science , chemistry , physics , nuclear magnetic resonance , artificial intelligence , telecommunications , environmental chemistry , quantum mechanics , evolutionary biology , biology

A procedure is described to characterise the performance of an imaging X‐ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical‐state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

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