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Monte Carlo simulation of Nb Kα secondary fluorescence in EPMA: comparison of PENELOPE simulations with experimental results
Author(s) -
Fournelle John H.,
Kim Sungtae,
Perepezko John H.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2114
Subject(s) - monte carlo method , electron microprobe , x ray fluorescence , fluorescence , electron probe microanalysis , diffusion , secondary electrons , eutectic system , boundary (topology) , phase (matter) , analytical chemistry (journal) , chemistry , statistical physics , materials science , physics , electron , optics , crystallography , mineralogy , thermodynamics , microstructure , statistics , nuclear physics , mathematics , chromatography , mathematical analysis , organic chemistry
Secondary fluorescence across phase boundaries is a difficult problem encountered in several electron probe microanalysis (EPMA) situations: diffusion couples; small phases enclosed in a larger phases; eutectic intergrowths; and thin films. In some cases, it is possible to construct nondiffused couples and to measure the amount of secondary fluorescence across the phase boundary, but in most cases this is difficult, time consuming, expensive, or impossible. It is thus desirable to model the secondary fluorescence by Monte Carlo methods. Here we compare the results of experimentally measured secondary fluorescence of Nb K α with results from the PENELOPE Monte Carlo program, and find that there is close correspondence. Copyright © 2005 John Wiley & Sons, Ltd.