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A new examination of secondary electron yield data
Author(s) -
Lin Yinghong,
Joy David C.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2107
Subject(s) - yield (engineering) , atomic number , atomic physics , electron , monte carlo method , function (biology) , energy (signal processing) , electron shell , excitation , physics , chemistry , mathematics , thermodynamics , quantum mechanics , ion , statistics , ionization , evolutionary biology , biology
A new and thorough examination of secondary electron (SE) yield as a function of primary energy ( E PE ) and atomic number Z for the 44 elements in the database1 is made. The principles of the semiempirical universal law for the SE yield are described and a template for Monte Carlo (MC) simulation is produced accordingly. Both universal curve fitting and MC simulation are made for the 44 elements. The resulted maximum SE yield δ m , corresponding primary energy $E_{\rm {PE}}^{\rm {m}}$ , SE excitation energy ε, and effective escape depth λ are tabulated and plotted as a function of atomic number Z. It is found that similarities exist in the profiles of ε and λ, δ m and $E_{\rm {PE}}^{\rm {m}}$ , and all of these parameters seem to have characteristics associated with atomic shell filling. Copyright © 2005 John Wiley & Sons, Ltd.