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Summary of the panel discussion on opportunities and needs
Author(s) -
Powell C. J.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2099
Subject(s) - nist , panel discussion , session (web analytics) , metrology , engineering physics , engineering , computer science , political science , nanotechnology , materials science , physics , business , optics , world wide web , natural language processing , advertising
At the NIST workshop on modeling electron transport for applications in electron and X‐ray analysis and metrology, there was a final panel discussion on the opportunities and needs in this area. A summary of the points made by some of the contributors in this session is given. Published in 2005 John Wiley & Sons, Ltd.
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