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XPS, AFM, ATR and TPD evidence for terraced, dihydrogen terminated, 1×1 (100) silicon
Author(s) -
Cerofolini G. F.,
Cali D.,
Galati C.,
Reina S.,
Renna L.,
Spinella N.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2063
Subject(s) - x ray photoelectron spectroscopy , silicon , attenuated total reflection , quenching (fluorescence) , desorption , thermal desorption spectroscopy , analytical chemistry (journal) , electron diffraction , infrared spectroscopy , thermal desorption , spectroscopy , materials science , chemistry , reflection (computer programming) , photoemission spectroscopy , absorption (acoustics) , diffraction , optics , optoelectronics , adsorption , nuclear magnetic resonance , fluorescence , physics , computer science , quantum mechanics , programming language , organic chemistry , composite material , chromatography
Abstract Heating (100) silicon at high temperature (say, higher than 850 °C) in H 2 , cooling to 670–700 °C in the same ambient, and quenching to room temperature in N 2 results in environmentally robust, terraced 1 × 1 (100) SiH 2 . Evidence for this conclusion is based on angle‐resolved x‐ray photoelectron spectroscopy, atomic force microscopy, infrared absorption spectroscopy in the attenuated total reflection mode, thermal programmed desorption, and reflection high‐energy electron diffraction. Copyright © 2005 John Wiley & Sons, Ltd.