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Summary of ISO/TC 201 standard: XVIII, ISO 19318:2004—surface chemical analysis—X‐ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
Author(s) -
Baer D. R.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2034
Subject(s) - x ray photoelectron spectroscopy , charge (physics) , charge control , analytical chemistry (journal) , binding energy , fixed charge , surface charge , spectroscopy , chemistry , atomic physics , materials science , physics , molecular physics , nuclear magnetic resonance , thermodynamics , quantum mechanics , power (physics) , battery (electricity) , chromatography
International Standard ISO 19318 specifies the minimum amount of information describing the methods of charge control and charge correction in measurements of core‐level binding energies for insulating specimens by x‐ray photoelectron spectroscopy, which is to be reported with the analytical results. Information is also provided on methods that have been found useful for charge control and charge correction in the measurement of binding energies. Copyright © 2005 John Wiley & Sons, Ltd.