Premium
Surface analysis of pulsed laser‐deposited V 2 O 5 thin films and their lithium intercalated products studied by Raman spectroscopy
Author(s) -
Ramana C. V.,
Smith R. J.,
Hussain O. M.,
Massot M.,
Julien C. M.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2018
Subject(s) - raman spectroscopy , pulsed laser deposition , substrate (aquarium) , pentoxide , lithium (medication) , vanadium , analytical chemistry (journal) , thin film , raman scattering , materials science , partial pressure , chemistry , oxygen , nanotechnology , optics , metallurgy , medicine , oceanography , physics , chromatography , endocrinology , geology , organic chemistry
Vanadium pentoxide films were prepared by pulsed laser deposition (PLD) and their surface structure evolution in relation to the growth temperature and as a function of lithium intercalation was studied. The deposition was made onto various substrate materials over a wide substrate temperature range of 30–500 °C, keeping the oxygen partial pressure at 100 mTorr. The surface properties of V 2 O 5 films were studied by Raman scattering spectroscopy in order to understand the effect of substrate temperature on the structure and growth behavior. The results indicated that the structure of PLD V 2 O 5 films is highly dependent on the growth temperature. The Raman spectra provide additional insight into the nature of the structural changes of lithiated films, showing the appearance of the δ‐ and γ‐phases of Li x V 2 O 5 . Copyright © 2005 John Wiley & Sons, Ltd.