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Summary of ISO/TC 201 standard: XXI. ISO 21270:2004—Surface chemical analysis—X‐ray photoelectron and Auger electron spectrometers—Linearity of intensity scale
Author(s) -
Seah M. P.
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2002
Subject(s) - spectrometer , intensity (physics) , linearity , x ray photoelectron spectroscopy , auger electron spectroscopy , analytical chemistry (journal) , auger , chemistry , scale (ratio) , electron , divergence (linguistics) , atomic physics , computational physics , optics , physics , nuclear magnetic resonance , nuclear physics , quantum mechanics , chromatography , linguistics , philosophy
Abstract This International Standard specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and x‐ray photoelectron spectrometers. It also includes methods to correct for intensity non‐linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid. Copyright © 2004 John Wiley & Sons, Ltd.