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Development of digital waveform measurement system for coincidence transmission electron microscopy
Author(s) -
Nishinaka Kenichi,
Kimura Yoshihide,
Takai Yoshizo
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1976
Subject(s) - coincidence , waveform , transmission (telecommunications) , transmission electron microscopy , optics , system of measurement , materials science , computer science , physics , electrical engineering , engineering , telecommunications , voltage , medicine , alternative medicine , pathology , astronomy
We have been developing a new analytical transmission electron microscope for coincidence transmission electron microscopy (TEM) that in principle enables the observation of elemental mapping images of trace elements. In the present paper, we report a new digital waveform measurement system for x‐ray detection that has been newly developed and installed, instead of an analogue coincidence detection system used in our previous work, to shorten the measurement time. The high‐speed measurement system based on a digital waveform fitting technique improves successfully the time resolution of coincidence TEM from 110 to 80 ns, leading to a 30% reduction of the total measurement time compared with that of the previous system. Copyright © 2005 John Wiley & Sons, Ltd.