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Phase transmission electron microscopy with aberration correction based on active defocus modulation: dynamic observation of surface atom movement
Author(s) -
Takai Yoshizo,
Nishikata Kentarou,
Kawasaki Tadahiro,
Kimura Yoshihide
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1975
Subject(s) - atom (system on chip) , transmission electron microscopy , relaxation (psychology) , phase (matter) , optics , slipping , modulation (music) , transmission (telecommunications) , materials science , chemistry , physics , molecular physics , atomic physics , geometry , computer science , psychology , social psychology , telecommunications , mathematics , organic chemistry , acoustics , embedded system
We have developed a phase transmission electron microscopy system that enables real‐time observation of spherical aberration‐free phase images based on active defocus modulation. With the use of this system, the cooperative movement of atoms on an Au(011) reconstructed surface was clearly observed at an atomic level. Relaxation of stress in a deformed crystal was also observed when slipping of (111) atom planes occurred. The dynamic behaviour of an atom‐sized Au wire that was elongated in the [001] direction was observed at a time resolution of 1/30 s, and its behaviour was different from that of a wire elongated in the [011] direction, which was observed in a previous study. Copyright © 2005 John Wiley & Sons, Ltd.