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Improvement of angle‐resolved electron energy analyser for high‐performance x‐ray photoelectron diffraction measurements
Author(s) -
Mamishin Shuichi,
Mochizuki Hidehiro,
Ishii Hideshi,
Kobayashi Hideo,
Iwai Hideo,
Watanabe Katsumi,
Taguchi Masami,
Owari Masanori,
Nihei Yoshimasa
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1970
Subject(s) - analyser , x ray photoelectron spectroscopy , photoelectric effect , diffraction , detector , optics , electron diffraction , materials science , aperture (computer memory) , electron , x ray detector , millisecond , reflection high energy electron diffraction , analytical chemistry (journal) , physics , chemistry , nuclear magnetic resonance , nuclear physics , chromatography , astronomy , acoustics
Abstract For more precise and rapid x‐ray photoelectron diffraction (XPED) measurements, we have improved an angle‐resolved electron energy analyser developed a ±1.4° diffraction plane aperture mode, and a novel high‐speed 64‐channel detector. In this study, a large number of photoelectrons from a newly developed diffraction plane aperture mode were detected by a novel high‐speed detector, facilitating rapid and precise XPED measurements. The Ti 2p XPED patterns from an SrTiO 3 (001) surface also revealed the performance of this improved analyser. In addition, high‐speed XPS measurements from an Ag polycrystal were performed for several milliseconds. Copyright © 2005 John Wiley & Sons, Ltd.