Improvement of angle‐resolved electron energy analyser for high‐performance x‐ray photoelectron diffraction measurements | Zendy

Mamishin Shuichi | Zendy; Mochizuki Hidehiro | Zendy; Ishii Hideshi | Zendy; Kobayashi Hideo | Zendy; Iwai Hideo | Zendy; Watanabe Katsumi | Zendy; Taguchi Masami | Zendy; Owari Masanori | Zendy; Nihei Yoshimasa | Zendy

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Improvement of angle‐resolved electron energy analyser for high‐performance x‐ray photoelectron diffraction measurements

Author(s) -

Mamishin Shuichi,

Mochizuki Hidehiro,

Ishii Hideshi,

Kobayashi Hideo,

Iwai Hideo,

Watanabe Katsumi,

Taguchi Masami,

Owari Masanori,

Nihei Yoshimasa

Publication year - 2005

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.1970

Subject(s) - analyser , x ray photoelectron spectroscopy , photoelectric effect , diffraction , detector , optics , electron diffraction , materials science , aperture (computer memory) , electron , x ray detector , millisecond , reflection high energy electron diffraction , analytical chemistry (journal) , physics , chemistry , nuclear magnetic resonance , nuclear physics , chromatography , astronomy , acoustics

For more precise and rapid x‐ray photoelectron diffraction (XPED) measurements, we have improved an angle‐resolved electron energy analyser developed a ±1.4° diffraction plane aperture mode, and a novel high‐speed 64‐channel detector. In this study, a large number of photoelectrons from a newly developed diffraction plane aperture mode were detected by a novel high‐speed detector, facilitating rapid and precise XPED measurements. The Ti 2p XPED patterns from an SrTiO 3 (001) surface also revealed the performance of this improved analyser. In addition, high‐speed XPS measurements from an Ag polycrystal were performed for several milliseconds. Copyright © 2005 John Wiley & Sons, Ltd.

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