Premium
Development of the spin‐polarized atom‐surface scattering method for characterizing surface magnetism: detection efficiency of the microchannel plate
Author(s) -
Ikedo Y.,
Sueyoshi Y.,
Shimizu T.,
Hirose E.,
Hori H.,
Torikai E.
Publication year - 2005
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1963
Subject(s) - magnetism , scattering , atom (system on chip) , spin (aerodynamics) , atomic physics , chemistry , ion , asymmetry , ionization , condensed matter physics , molecular physics , physics , optics , organic chemistry , quantum mechanics , computer science , thermodynamics , embedded system
The energy, charge and angle dependence of the detection efficiency of the microchannel plate (MCP) for caesium (Cs) atoms and ions was studied for measuring the spin asymmetry of the ionization probability in the atom‐surface scattering process. Based on the model of a spin‐dependent scattering of a spin‐polarized and energy‐tunable Cs atomic beam at a magnetic surface, we have developed a new experimental method for characterizing surface magnetism. Copyright © 2005 John Wiley & Sons, Ltd.