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Monte‐Carlo simulation of secondary electron emission by x‐ray irradiation—an application of x‐ray absorption near‐edge structure (XANES)
Author(s) -
Iyasu Takeshi,
Tamura Keiji,
Shimizu Ryuichi,
Zhang Zengming,
Koshikawa Takanori,
Yoshikawa Hideki,
Fukushima Sei
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1932
Subject(s) - xanes , monte carlo method , synchrotron radiation , synchrotron , absorption (acoustics) , secondary electrons , beamline , x ray , irradiation , materials science , x ray spectroscopy , spectroscopy , physics , electron , atomic physics , chemistry , optics , nuclear physics , beam (structure) , statistics , mathematics , quantum mechanics
A Monte‐Carlo simulation program has been developed for describing x‐ray absorption near‐edge structure (XANES) observed by synchrotron radiation. The Monte‐Carlo simulation was applied for interpreting XANES spectroscopy on a polycrystalline Ag specimen under synchrotron irradiation with photon energy 3340–3390 eV around the absorption edge of the Ag L α line at 3352 eV. The results clearly indicate that Monte‐Carlo simulation describes the experimental results with considerable success. Dependence of secondary electron yield on the incident angle of synchrotron radiation was also studied. Copyright © 2004 John Wiley & Sons, Ltd.