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48th International Field Emission Symposium (IFES) & 15th International Vacuum Microelectronics Conference (IVMC)
Author(s) -
Danoix Frederic,
Forbes Richard
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1908
Subject(s) - library science , citation , field electron emission , engineering physics , field (mathematics) , editorial board , operations research , media studies , engineering , physics , computer science , sociology , nuclear physics , mathematics , electron , pure mathematics
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