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XPS analysis of electronic density of iron tetraazamacrocycle through Fe 2p binding energies on the 3‐imidazolilpropyl‐modified surface of oxidized n‐Si(100)
Author(s) -
Andresa Juliana Salvador,
Moreira Leonardo Marmo,
Magalhães Janildo Lopes,
Gonzalez Eduardo Perez,
Landers Richard,
RodriguesFilho Ubirajara Pereira
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1879
Subject(s) - wafer , x ray photoelectron spectroscopy , adsorption , molecule , chemistry , silicon , binding energy , materials science , analytical chemistry (journal) , nanotechnology , chemical engineering , organic chemistry , atomic physics , physics , engineering
Abstract This paper describes the preparation of metallo‐organic thin films of [FeTIM(CH 3 CN) 2 ] 2 + complex, where TIM stands for 2,3,9,10‐tetramethyl‐1,4,8,11‐tetraazacyclotetradeca‐1,3,8,10‐tetraene on oxidized silicon wafer, SiO 2 /Si, previously treated with 3‐imidazolilpropyltrimethoxysilane, 3‐IPTS. X‐ray photoemission lines of Fe 2p were used to probe the iron chemical environment in the physically and chemically adsorbed macrocycle complexes. As FeTIM can bind CO, NO or N ‐heterocycle, a built‐on Si wafer sensor device could be envisaged for these molecules. Copyright © 2004 John Wiley & Sons, Ltd.