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Characterization of AgAsS and AgSbS amorphous films prepared by pulsed laser deposition
Author(s) -
Wagner T.,
Krbal M.,
Gutwirth J.,
Nemec P.,
Vlcek Mir.,
Frumar M.,
Perina V.,
Mackova A.,
Hnatovitz V.,
Kasap S. O.,
Vlcek Mil.
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1860
Subject(s) - characterization (materials science) , amorphous solid , pulsed laser deposition , deposition (geology) , materials science , analytical chemistry (journal) , chemical engineering , nanotechnology , thin film , chemistry , crystallography , environmental chemistry , geology , paleontology , sediment , engineering
Thin amorphous films of AgAsS and AgSbS systems have been prepared by pulsed laser deposition (PLD) at five different conditions, i.e. at different pulse energies and pulse repetition intervals of the KrF laser. The obtained films were analysed by RBS, ERDA (elastic recoil detection analysis) spectral analysis and also EDXA elemental analysis. The results of RBS and EDXA analysis were compared to the composition of the source bulk glass materials. Film compositions varied compared to the source material according to the deposition condition with film composition close to the stoichiometric one, i.e. AgAsS 2 and AgSbS 2 could be prepared by the PLD technique. RBS spectroscopy is known as an important tool for establishing depth distribution of the elements within the prepared films. The thickness of the films was chosen so that depth profiling of the entire layer is possible. ERDA allowed us to find, apart from all obvious atoms (Ag, As, Sb, S), also H atoms present in the films. The structure of the films has been studied by Raman spectroscopy as well. Vibration bands characteristic of As(Sb)S 2 AgAs(Sb)S 2 structural units present in prepared films have been observed. The films are potentially applicable for optical memories (e.g. digital video discs). Copyright © 2004 John Wiley & Sons, Ltd.