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Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra‐low‐angle microtomy
Author(s) -
Hinder Steven J.,
Watts John F.,
Lowe Chris
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1830
Subject(s) - x ray photoelectron spectroscopy , coating , materials science , polymer , composite material , microtome , contact angle , chemical engineering , analytical chemistry (journal) , polymer chemistry , chemistry , chromatography , optics , engineering , physics
Conventional rotary microtomy in combination with high‐precision, ultra‐low‐angle sectioning blocks have been used to produce cross‐sectional, ultra‐low‐angle tapers in polymeric coating systems. Tapered samples produced by ultra‐low‐angle microtomy (ULAM) have been employed in the investigation of intercoat bonding interfaces in multilayer polymeric coatings and for the compositional depth profiling of polymer/polymer + additives systems. X‐ray photoelectron spectroscopy (XPS) cross‐sectional analysis of a poly(vinylidene difluoride) (PVdF) based topcoat and a poly(urethane) based primer interface exposed by ULAM processing indicates diffusion of fluorine‐containing components of the PVdF topcoat formulation into the uppermost nanometres of the underlying poly(urethane) primer. It is demonstrated that a ULAM exposed, cross‐sectional multilayer interface, with a taper of <0.05°, investigated by high‐resolution XPS employing a 15 µm spot‐size enables the interface region to be probed at a depth resolution of <20 nm. Depth profiling characterization by XPS of a polyamide powder coating with an organosilane adhesion promoter reveals a silicon concentration gradient within the cured polymer. This result demonstrates that the organosilane preferentially segregates to the surface regions of the cured polymer coating system. Copyright © 2004 John Wiley & Sons, Ltd.