The influence of surface roughness on the adhesion force | Zendy

Meine K. | Zendy; Kloß K. | Zendy; Schneider T. | Zendy; Spaltmann D. | Zendy

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The influence of surface roughness on the adhesion force

Author(s) -

Meine K.,

Kloß K.,

Schneider T.,

Spaltmann D.

Publication year - 2004

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.1738

Subject(s) - wafer , adhesion , surface roughness , surface energy , cantilever , atomic force microscopy , surface (topology) , surface finish , surface force , silicon , contact area , polymer , materials science , composite material , nanotechnology , chemistry , mechanics , physics , optoelectronics , geometry , mathematics

Adhesion measurements are presented which were carried out with an atomic force microscope between polymer balls attached to a cantilever and a silicon wafer under ultra high vacuum conditions. In using a silicon surface with a defined structure a correlation between adhesion force and contact area was found. This correlation could partly be explained by the Johnson–Kendall–Roberts model, if a change of the surface energy is assumed as a result of the structuring. For a constant geometric contact area an additional structuring leads to a decrease of the adhesion force. Copyright © 2004 John Wiley & Sons, Ltd.

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