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Effective depths for surface excitation derived by reflection electron energy‐loss spectroscopy analysis
Author(s) -
Zhang Zengming,
Iyasu Takeshi,
Shimizu Ryuichi,
Goto Keisuke,
Koshikawa Takanori,
Tamura Keiji
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1732
Subject(s) - electron energy loss spectroscopy , inelastic mean free path , excitation , electron , spectroscopy , mean free path , atomic physics , surface plasmon , reflection (computer programming) , chemistry , inverse , plasmon , surface (topology) , computational physics , dielectric , physics , molecular physics , optics , quantum mechanics , mathematics , computer science , geometry , programming language
A method of estimation is proposed for determining the effective depth of surface excitation. For this, the effective differential inverse inelastic mean free path (DIIMFP) is presumed to be represented as a linear combination of theoretical DIIMFPs for surface and bulk excitation, which are derived by the use of optical dielectric constants. The effective DIIMFP in the approach is derived by a reflected electron energy‐loss spectroscopy analysis based on the extended Landau approach. The present analysis for 1 kV electrons has led to a simple estimation of the effective depth for surface excitations (∼14.5 Å for Al and ∼21 Å for Ag), agreeing well with an estimation given by υ/ ω s , where υ and ω s are the velocity of the primary electrons and the average surface plasmon frequency, respectively. Copyright © 2004 John Wiley & Sons, Ltd.