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Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr 2 O 3 powder sample prepared with adhesive tape
Author(s) -
Ünveren E.,
Kemnitz E.,
Hutton S.,
Lippitz A.,
Unger W. E. S.
Publication year - 2004
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1655
Subject(s) - x ray photoelectron spectroscopy , spectral line , multiplet , analytical chemistry (journal) , spectrometer , satellite , materials science , x ray , chemistry , nuclear magnetic resonance , physics , optics , chromatography , astronomy
By using modern XPS systems it is possible to obtain spectra with well‐resolved spin orbit, multiplet and field splitting even with powder samples mounted using adhesive tape. Measurement of Cr 2 O 3 powder with the latest generation of XPS spectrometers, which are able to analyse non‐conductive powders with ultimate energy resolution, revealed multiplet splitting features and satellite emission in the Cr 2p spectrum. Therefore, peak‐fit analysis of Cr 2p XPS spectra of Cr(III) compounds requires a more appropriate approach and common practice has to be reconsidered. One possible way to analyse this spectrum is proposed, based on the experimental and theoretical work of other authors. Copyright © 2004 John Wiley & Sons, Ltd.