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Electron spectroscopic investigation of ethylmethylsulfide/nickel interface
Author(s) -
Syed J. A.,
Sardar S. A.,
Yagi S.,
Tanaka K.
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1627
Subject(s) - x ray photoelectron spectroscopy , nickel , substrate (aquarium) , adsorption , chemistry , molecule , analytical chemistry (journal) , crystallography , nuclear magnetic resonance , physics , organic chemistry , oceanography , geology
To demonstrate the interaction of ethylmethylsulfide (C 2 H 5 SCH 3 ) with an Ni(110) surface, we use x‐ray photoelectron spectroscopy and x‐ray absorption near‐edge structure measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. The S–C 2 H 5 and S–CH 3 bonds are found to be oriented at angles of 46 ± 5° and 14 ± 5° from the surface, respectively. A qualitative estimation of charge transfer from substrate to molecule is carried out by S 1s XPS measurements. Copyright © 2003 John Wiley & Sons, Ltd.