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Measurement of thermal parameters and mechanical properties of polymers by atomic force microscopy
Author(s) -
Meincken M.,
Balk L. J.,
Sanderson R. D.
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1620
Subject(s) - polymer , cantilever , materials science , glass transition , atomic force microscopy , kelvin probe force microscope , thermal , microscopy , scanning thermal microscopy , composite material , analytical chemistry (journal) , nanotechnology , optics , chemistry , thermodynamics , physics , organic chemistry
A novel technique has been developed to determine thermal transitions locally, e.g. the glass transition of polymers, with atomic force microscopy (AFM). The microscope was operated in stationary non‐contact mode, using it like a dynamic mechanical analyser on a molecular scale, thereby measuring the resonance frequency of the AFM cantilever, which oscillates above the sample surface, as a function of temperature. The thermal transitions of the underlying polymer are clearly visible as a change in the resonance frequency. Using the AFM in this mode allows the determination of the thermal properties of a material at a specific spot on the sample on a molecular scale. Measurements were performed on different polymers, polymer blends, structured polymers, layered systems and thin films. Copyright © 2003 John Wiley & Sons, Ltd.