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Lithium intercalation on amorphous V 2 O 5 thin film, obtained by r.f. deposition, using in situ sample transfer for XPS analysis
Author(s) -
Salvi Anna Maria,
Guascito Maria Rachele,
DeBonis Angela,
Simone Francesca,
Pennisi Agostino,
Decker Franco
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1617
Subject(s) - pentoxide , x ray photoelectron spectroscopy , electrochromism , amorphous solid , vanadium , intercalation (chemistry) , lithium (medication) , electrochemistry , analytical chemistry (journal) , deposition (geology) , chemistry , thin film , materials science , sputtering , chemical engineering , electrode , inorganic chemistry , nanotechnology , crystallography , medicine , paleontology , sediment , engineering , biology , endocrinology , chromatography
Spectroscopic and electrochemical properties of amorphous V 2 O 5 films, prepared by r.f. sputter deposition, were compared before and after electrochemical lithium intercalation. The films gave a cyclic voltammogram typical of vanadium pentoxide with two/three steps of reversible electrochromism (yellow–green–blue). The expected effect of lithiation on chemical state and surface composition was monitored using XPS. A careful curve‐fitting procedure of the detailed spectra was adopted and the in‐depth profile analysis of the intercalated films clearly showed their surface reorganization as a function of time and ultrahigh vacuum conditions. The first objective of this work was to establish the influence of lithium intercalation while minimising degradation effects due to its high reactivity with the atmosphere, taking advantage of the in situ sample transfer facility. Copyright © 2003 John Wiley & Sons, Ltd.