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Fracture‐induced reconstruction of a chalcopyrite (CuFeS 2 ) surface
Author(s) -
Klauber Craig
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1539
Subject(s) - chalcopyrite , x ray photoelectron spectroscopy , chemistry , binding energy , leaching (pedology) , dimer , crystallography , mineralogy , geology , copper , chemical engineering , atomic physics , physics , organic chemistry , soil science , soil water , engineering
Two factors contributing to the high binding energy asymmetry of the S 2p XPS peak for virginal chalcopyrite (CuFeS 2 ) surfaces have been identified. The Cu, Fe and S 2p spectra of freshly fractured surfaces of chalcopyrite have been found to display a loss feature at ∼2.6 eV that is attributed to an interband transition S 3p → Fe 3d, from occupied S levels to unoccupied Fe levels. For leached chalcopyrite systems, intensity on that side of the S 2p peak sometimes has been interpreted erroneously in terms of oxidized species such as polysulphides. A second prominent S 2p component has been determined at a binding energy of 161.9 eV and identified as the sulphide dimer S 2 2− . With supporting evidence, a simultaneous surface reconstruction and redox reaction model has been developed for the fracturing of chalcopyrite, leading to an exposed surface phase of about two layers thick with a 50% pyritic content. The pyritic nature of the fractured chalcopyrite surface has implications for understanding the leaching chemistry of chalcopyrite. Copyright © 2003 John Wiley & Sons, Ltd.