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ToF‐SIMS and XPS surface characterization of novel perfluoropolyether–urethane ionomers from aqueous dispersions
Author(s) -
Canteri R.,
Speranza G.,
Anderle M.,
Turri S.,
Radice S.
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1535
Subject(s) - x ray photoelectron spectroscopy , aqueous solution , secondary ion mass spectrometry , coating , polymer , fluorine , chemical engineering , chemistry , ionic bonding , characterization (materials science) , polymer chemistry , ionomer , macromolecule , materials science , ion , copolymer , organic chemistry , nanotechnology , biochemistry , engineering
In this work a new class of ionomeric block perfluropolyether (PFPE) polyurethanes are presented; these polymers are obtained in the form of aqueous dispersions due to the presence of hydrophilic sites (ionomeric groups such as acetates or trialkylammonium salts) along the macromolecular chain, offering the chance to combine PFPEs in a variety of possible structures for coating or surface treatments with an environmentally friendly use. X‐ray photoelectron spectroscopy analysis at two different sampling depths, as well as time‐of‐flight secondary ion mass spectrometry analysis modelled by the use of principal component analysis (PCA), were used to investigate the first nanometres of the surface samples. It resulted in a clear surface enrichment in fluorine, and the different extent of the fluorine stratification will be discussed in relation to the ionic character, film‐forming from water and cross‐linking. Copyright © 2003 John Wiley & Sons, Ltd.