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Structural characterization of C 60 nanowhiskers formed by the liquid/liquid interfacial precipitation method
Author(s) -
Miyazawa K.,
Kuwasaki Y.,
Hamamoto K.,
Nagata S.,
Obayashi A.,
Kuwabara M.
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1506
Subject(s) - whiskers , transmission electron microscopy , materials science , precipitation , characterization (materials science) , nanowire , electrical resistivity and conductivity , curvature , molecule , chemical engineering , scanning electron microscope , planar , electrical conductor , crystallography , liquid crystal , nanotechnology , composite material , chemistry , optoelectronics , organic chemistry , geometry , physics , mathematics , engineering , computer graphics (images) , meteorology , computer science , electrical engineering
The structure of C 60 whiskers fabricated by using the liquid/liquid interfacial precipitation method is analysed with transmission electron microscopy (TEM). The C 60 whiskers with submicrometre diameters, named ‘C 60 nanowhiskers (C 60 NWs)’, contain (002) c planar faults, and the centre‐to‐centre distance between the C 60 molecules along the growth axis of C 60 NWs is shortened ∼1% compared with that of pristine C 60 crystals, indicating the formation of chemical bondings between the C 60 molecules along [110] c ([100] t ) close‐packed directions of the C 60 NWs. The electrical resistivity of C 60 whiskers decreased on decreasing their diameter. This result suggests that the C 60 NWs are electrically conductive. The C 60 whiskers are very flexible and could form a semicircle with a curvature radius of 38 µm. Copyright © 2003 John Wiley & Sons, Ltd.