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Distribution of lattice parameters in strain‐compensated MQW laser diodes
Author(s) -
Seo Satoru,
Matsuda Takeyoshi,
Mitose Kengo,
Iwase Fusako
Publication year - 2003
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1504
Subject(s) - lattice (music) , diode , laser , fourier transform , lattice constant , optics , particle in a one dimensional lattice , condensed matter physics , materials science , physics , statistical physics , diffraction , optoelectronics , reciprocal lattice , quantum mechanics , acoustics
We have developed a lattice image analysis method that gives lattice parameters directly from the lattice image of multiple quantum well (MQW) laser diodes, in order to judge whether the strain‐compensated structure is adopted or not. The method can handle a large amount of image data. The noise element in the lattice image is removed when the one‐dimensional Fourier transform is applied, and the lattice parameter value is obtained with good precision and good accuracy. The distribution of lattice parameters is valuable for evaluating the structure. Copyright © 2003 John Wiley & Sons, Ltd.