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Relationship between the structure of polymers with well‐defined fluorocarbon segmental lengths and the formation of secondary ions in SIMS
Author(s) -
Zhou Hui,
Chan ChiMing,
Weng LuTao,
Ng KaiMo,
Li Lin
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1470
Subject(s) - ion , secondary ion mass spectrometry , fluorocarbon , fragmentation (computing) , polymer , chemistry , static secondary ion mass spectrometry , analytical chemistry (journal) , mass spectrometry , chromatography , organic chemistry , computer science , operating system
Abstract A series of fluorinated polymers were studied using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to investigate the relationship between the structures of the polymers and secondary ions. The influence of fluorocarbon segment length on the formation of secondary ions in a ToF‐SIMS process was studied. The characteristic negative and positive ions were found to be related to the chemical structure of the repeat units of the polymers. The ToF‐SIMS results provided some useful information on the fragmentation mechanism of positive and negative secondary ions. The results indicate that recombination of the ions in the gas phase is unlikely in a static SIMS process. Copyright © 2002 John Wiley & Sons, Ltd.