Premium
Atomic force microscopy imaging and cutting of beaded carbon nanotubes deposited on glass
Author(s) -
Singjai P.,
Songmee N.,
Tunkasiri T.,
Vilaithong T.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1468
Subject(s) - carbon nanotube , transmission electron microscopy , materials science , scanning electron microscope , nanotechnology , atomic force microscopy , composite material , conductive atomic force microscopy , microscopy , electrostatic force microscope , optics , physics
Abstract We use contact force mode atomic force microscopy (AFM) to study the structures and to cut carbon nanotubes (CNTs) adsorbed on a glass slide. In addition to regular CNTs, beaded carbon nanotubes (BCNTs) were also observed when preparing products using electric current heating with the pencil technique. Imaging by contact force mode AFM could be achieved at low contact force, whereas cutting could be operated at a higher contact force in conjunction with the y ‐scan direction being disabled. Cutting of BCNTs can be done without any translation of the beaded tubes. It is believed that the similar ingredients of the beaded oxides and the glass slide make them bond preferentially by chemical force. Furthermore, the morphologies were characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Copyright © 2002 John Wiley & Sons, Ltd.