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Angle‐resolved XPS characterization of urea formaldehyde–epoxy systems
Author(s) -
Perruchot Christian,
Watts John F.,
Lowe Chris,
White Richard G.,
Cumpson Peter J.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1465
Subject(s) - x ray photoelectron spectroscopy , epoxy , elemental analysis , carbon fibers , coating , formaldehyde , characterization (materials science) , chemical composition , urea formaldehyde , chemistry , analytical chemistry (journal) , materials science , chemical engineering , organic chemistry , nanotechnology , composite material , layer (electronics) , composite number , adhesive , engineering
A series a coil coating primers, based on high‐molecular‐weight epoxy resins and a urea formaldehyde crosslinking agent, have been investigated by angle‐resolved XPS (ARXPS) analysis. The addition of a low amount of flow agent additive (<0.2 wt.%) in the formulations induced significant changes in the surface composition and the peak‐fitted carbon spectra compared with the reference formulation containing no additive. Characterization of the surface composition of the various coatings at different take‐off angles of analysis, combined with the use of a public domain forward transform routine (ARCtick 1.0 software, from the National Physical Laboratory, UK), allows the determination of the elemental depth profile for each formulation. In addition, changes of the relative intensities of specific components in the peak‐fitted carbon signals allow the determination of chemical depth profiles within the analysis depth of XPS (∼4–5 nm). Elemental and chemical compositions clearly demonstrate a preferential segregation of the flow agent additive towards the air/surface interface of the coating. The thickness of the additive outerlayer was evaluated in the range of 0.5–1.0 nm using the variations of the elemental and carbon chemistry depth profiles, which shows changes in the concentration of the additive. Copyright © 2002 John Wiley & Sons, Ltd.