Premium
Quantitative XPS analysis of aluminium in the presence of copper
Author(s) -
Hazell Leonard B.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1455
Subject(s) - aluminium , copper , x ray photoelectron spectroscopy , quantitative analysis (chemistry) , metallurgy , computer science , chemistry , materials science , engineering , chemical engineering
Quantification of aluminium in the presence of copper is a fundamental problem in XPS analysis due to peak overlap. This article presents and demonstrates the utility of a simple approach to alleviate this difficulty based on measurement of the P : S combination peak area ratio. It is particularly appropriate for inclusion in this Festshrift edition of the journal dedicated to Professor Jim Castle, who has worked extensively on copper–aluminium alloys throughout his long career. Incorporation of the method into commercial data systems and, particularly, an expert system is recommended so that the analyst can be alerted to the likely presence of aluminium and provided with a means to quantify the amount. Copyright © 2002 John Wiley & Sons, Ltd.