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Compositional and structural characterization of zirconia films with reticular structure obtained by spray pyrolysis
Author(s) -
Martin F.,
Ayouchi R.,
Ruiz C.,
RamosBarrado J. R.,
Leinen D.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1396
Subject(s) - materials science , x ray photoelectron spectroscopy , cubic zirconia , amorphous solid , chemical engineering , annealing (glass) , thin film , tetragonal crystal system , oxide , layer (electronics) , metallurgy , composite material , crystal structure , crystallography , nanotechnology , chemistry , ceramic , engineering
Zirconia (ZrO 2 ) films with reticular structure, to be used as support in catalysis, have been deposited on AISI‐304 stainless steel held at 473 K by spray pyrolysis using aqueous solutions of zirconyl chloride octahydrate (ZrOCl 2 ·8H 2 O) as precursor. As‐deposited films and films annealed in air to different temperatures after deposition have been studied by x‐ray diffraction (XRD), SEM and XPS. It was found that the crystal structure of the ZrO 2 films changes from amorphous to tetragonal and that the films were uniform and well adhered to the stainless‐steel substrate for annealing temperatures up to 773 K. However, films annealed to 873 K crack and peel off from the substrate owing to the growth of an interfacial oxide layer between the ZrO 2 film and the stainless‐steel substrate. The fracture, which leads to delamination of the ZrO 2 film, occurs through the interfacial oxide layer. XPS depth profiling revealed that this interfacial oxide layer is of varying composition (containing iron, chromium and nickel) with depth. Copyright © 2002 John Wiley & Sons, Ltd.