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Quantitative analysis of the plasmon loss intensities in x‐ray photoelectron spectra of magnesium
Author(s) -
Kurth M.,
Graat P. C. J.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1287
Subject(s) - plasmon , chemistry , surface plasmon , spectral line , magnesium , excitation , x ray photoelectron spectroscopy , localized surface plasmon , electron , atomic physics , aluminium , analytical chemistry (journal) , molecular physics , optics , physics , nuclear magnetic resonance , organic chemistry , quantum mechanics , astronomy , chromatography
X‐ray photoelectron spectra of free‐electron metals such as magnesium and aluminium contain pronounced electron energy‐loss peaks due to plasmon excitations. Part of the intensity contained in these plasmon peaks is of an intrinsic nature. In this work a procedure is presented that allows the determination of intrinsic and extrinsic contributions to the plasmon loss structure and accounts for possibly different electronic properties at the surface. It is based on the reconstruction of a spectrum by convolution of physically realistic functions for the x‐ray energy distribution, the core‐level main peak, the cross‐sections for plasmon excitation and instrumental broadening. The procedure has been applied to an Mg 2p spectrum, giving a total intrinsic plasmon contribution of 46% relative to the main peak intensity. Copyright © 2002 John Wiley & Sons, Ltd.