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Characterization of thin Co/ZrO 2 catalytic films by XPS, SEM and SAM
Author(s) -
Stefanov P.,
Atanasova G.,
Robinson K.,
Julbe A.,
Guizard C.,
O'Hara P.,
Marinova Ts.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1258
Subject(s) - cubic zirconia , x ray photoelectron spectroscopy , cobalt , catalysis , materials science , scanning electron microscope , chemical engineering , nuclear chemistry , chemistry , composite material , metallurgy , organic chemistry , ceramic , engineering
Abstract Thin Co/ZrO 2 and Co/S‐ZrO 2 catalytic films for hydrocarbon‐selective catalytic reduction (HC‐SCR) of NO x were prepared and characterized by means of XPS, SEM and scanning Auger microscopy (SAM). Zirconia was deposited on a fibrous inconel support (Bekaert) by the sol–gel method. Cobalt was deposited on pure and pre‐sulphated zirconia films by impregnation with a 6% CoCl 2 solution. The photoelectron spectra indicated that cobalt was present mainly in the Co 2+ state in the form of CoO‐like species. The SEM/SAM results showed homogeneous distribution and a smaller size of the Co particles deposited on pre‐sulphated zirconia compared with cobalt deposited on pure zirconia. The results indicated that sulphating of zirconia improved the dispersion of cobalt on the surface, which is a prerequisite for a good SCR performance. Copyright © 2002 John Wiley & Sons, Ltd.