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Resonance tracking ultrasonic atomic force microscopy
Author(s) -
Kobayashi K.,
Yamada H.,
Matsushige K.
Publication year - 2002
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.1168
Subject(s) - cantilever , resonance (particle physics) , phase (matter) , non contact atomic force microscopy , optics , microscopy , ultrasonic sensor , groove (engineering) , tracking (education) , beam (structure) , materials science , chemistry , acoustics , physics , kelvin probe force microscope , atomic physics , composite material , psychology , pedagogy , organic chemistry , metallurgy
We have developed a new resonance tracking ultrasonic atomic force microscopy (UAFM) technique that measures the contact resonance frequency of a cantilever beam. The cantilever beam is vibrated at its contact resonance frequency by applying positive feedback while the tip near the end of the beam is kept in contact with the sample surface. The topographic image is acquired in normal contact mode while the contact resonance frequency is tracked by an extremely sensitive phase‐locked loop (PLL) circuit for the UAFM image. The UAFM image was obtained on a phase‐change recording medium (rewritable compact disc). The image showed a variation in the contact resonance frequency as large as 150 Hz in the groove, which probably is caused by the difference in elastic properties between the crystalline phase and the amorphous phase. Copyright © 2002 John Wiley & Sons, Ltd.